| 摘要 |
<p>Disclosed is an apparatus for detecting a position of an electronic part (1), the apparatus comprising first and second light sources (6, 8) arranged so that an electronic part (1) attracted by attraction means (5) is sandwiched therebetween, a diffusion plate (9) provided between the attraction means (5) and the second light sources (8), and an imaging means (10, 11) provided below the diffusion plate (9). The light from the first light sources (6) is irradiated on the electronic part (1) and the transmission light from the electronic part (1) is applied to the imaging means (10, 11), or the light from the second light sources (8) is irradiated on the electronic part (1) and the reflected light is selectively applied to the imaging means (10, 11) through a through-hole (13) of the diffusion plate (9) to detect a position of the electronic part (1).</p> |
