发明名称 |
MASK FOR LITHOGRAPHY AND ITS PRODUCTION |
摘要 |
PURPOSE:To provide a mask for lithography having excellent dimensional accuracy and resolution and to provide a method by which this mask can be produced extremely easily. CONSTITUTION:A SnO2 thin film 2 of 0.2mum thickness is formed on a transparent quartz glass plate 1. The SnO2 thin film 2 is selectively irradiated with an electron beam 3 under conditions of 20muC/cm<2> and 0.5mum address unit (beam diameter). During radiation, the reduction reaction (SnO2 Sn+O2) proceeds to change the area irradiated with the electron beam 3 into reduced product (Sn) 4 having shielding property. Thus, the mask for lithography is obtd. |
申请公布号 |
JPH05119465(A) |
申请公布日期 |
1993.05.18 |
申请号 |
JP19910284764 |
申请日期 |
1991.10.30 |
申请人 |
TOSHIBA CORP |
发明人 |
SHIGEMITSU FUMIAKI;OKUMURA KATSUYA |
分类号 |
G03F1/54;H01L21/027;H01L21/302;H01L21/3065 |
主分类号 |
G03F1/54 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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