发明名称 MASK FOR LITHOGRAPHY AND ITS PRODUCTION
摘要 PURPOSE:To provide a mask for lithography having excellent dimensional accuracy and resolution and to provide a method by which this mask can be produced extremely easily. CONSTITUTION:A SnO2 thin film 2 of 0.2mum thickness is formed on a transparent quartz glass plate 1. The SnO2 thin film 2 is selectively irradiated with an electron beam 3 under conditions of 20muC/cm<2> and 0.5mum address unit (beam diameter). During radiation, the reduction reaction (SnO2 Sn+O2) proceeds to change the area irradiated with the electron beam 3 into reduced product (Sn) 4 having shielding property. Thus, the mask for lithography is obtd.
申请公布号 JPH05119465(A) 申请公布日期 1993.05.18
申请号 JP19910284764 申请日期 1991.10.30
申请人 TOSHIBA CORP 发明人 SHIGEMITSU FUMIAKI;OKUMURA KATSUYA
分类号 G03F1/54;H01L21/027;H01L21/302;H01L21/3065 主分类号 G03F1/54
代理机构 代理人
主权项
地址