发明名称 MOS device having a well layer for controlling threshold voltage
摘要 The present invention provides a semiconductor device having a well, formed in a semiconductor substrate by using a mask in which a mask pattern width of a portion corresponding to an opening diameter is equal to or less than twice the diffusion depth of the well layer, and a gate electrode formed to have the well layer as a channel region of a MOS transistor. The well formed in this manner has a substantially semi-circular section to facilitate impurity concentration control in the substrate surface. When a plurality of types of opening patterns having small pattern widths are formed in a single mask, MOS transistors having different threshold voltages can be formed in a single process.
申请公布号 US5210437(A) 申请公布日期 1993.05.11
申请号 US19920925411 申请日期 1992.08.10
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SAWADA, SHIZUO;IWASAKI, SEIKO
分类号 H01L21/266;H01L21/336;H01L21/8234;H01L29/10 主分类号 H01L21/266
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