| 摘要 |
PURPOSE:To obtain means for easily confirming the position of the casting area of X-rays in an X-ray irradiation apparatus for use in the X-ray fluorescence analysis, X-ray diffraction or the like. CONSTITUTION:This apparatus is comprised of a sample holding device 36 which has an X-ray detecting element 37 to detect the position of the casting area of X-rays arranged at the casting surface of X-rays. In this case, a first- dimensional X-ray detecting element which can correctly detect the position of the casting area of X-rays is used as the X-ray detecting element 37. Or, an X-ray detecting element which can detect the entering amount of X-rays or photon energy is used as the X-ray detecting element. Moreover, this apparatus is provided with an adjusting mechanism which makes an adjustment so that the detecting surface of the X-ray detecting element is even with the upper surface of a to-be-measured sample, or a mechanism to fix the sample to the sample supporting device through the action of vacuum suction or electrostatic suction. |
