发明名称 SUBSTRATE PAGE DATA ANALYSIS SYSTEM
摘要 PURPOSE:To improve a quality by providing a means which stores the process condition of each mounted face at each page by using a page identifying code by which the mounted face can be identified to be added to a character code printed on a mounted substrate with a face, and a means which stores inspected data after a soldering reflow at each page and mounted face. CONSTITUTION:A defective phenomenon, defective part, and repair content are automatically or manually inputted from terminals 35 and 40 as the result of the check, the data and the identification code of the substrate read from picture identifying devices 34 and 39 are fetched by personal computers 33 and 38, and synthesized data 36 and 41 are transferred through a network 42 to a host computer 43. The host computer 43 records the data from the personal computers 25, 28, 33, and 38. The host computer 43 can relate manufacture histories 27 and 31 with the checked result information 36 and 41 by using the identification code as a retrieval key, so that the analysis of the defective content and the cause can be attained independently at every mounted face.
申请公布号 JPH05108845(A) 申请公布日期 1993.04.30
申请号 JP19910267421 申请日期 1991.10.16
申请人 HITACHI LTD 发明人 SATO SHIGERU;NAKAZATO JUN;FUKUDA TAKUO;ONO ISAO;OI TERUO;NEMEZAWA SHIGEO;SHIMOSHA SADAO
分类号 H05K13/08;G06F17/40 主分类号 H05K13/08
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