| 摘要 |
PURPOSE:To improve the efficiency of logical simulation and decrease man-hours by suppressing the occurrence of a logical defect due to the same cause. CONSTITUTION:This logical simulation system utilizes a test program and consists of a logic circuit 1, a test instruction array group 2, a test instruction array takeout device 3, a code conversion device 4, a same-cause logical defect decision device 5, a logical defect information file 6, a skip instruction array file 7, a result decision device 9, etc. Then information codes in the logical defect information file 6 are compared with a test contents code obtained by the code conversion device 4; if there is a corresponding code found, a same- cause logical defect is decided and stored in the skip instruction array file 7 and then processing is repeated from the next test instruction array, but when no corresponding code is found, simulation is performed and the result decision device 9 makes an automatic decision. |
