摘要 |
PURPOSE:To exactly execute a diagnosis and to shorten the diagnostic time by inferring an inspection image in the past having an image list parameter corresponding to an image list parameter of an unread shadow image in the kind of an inferred image list. CONSTITUTION:In a work station 4, from an unread shadow image displayed on an image display means 9, a desired unread shadow image is selected by an image switching means 14. Subsequently, based on the kind of an inspection contained in inspection data of the unread shadow image, the kind of an image list to the inspection image in the past is determined. Next, under the kind of this determined image list, this time an inspection image in the past having a parameter having the closest relation (corresponding) to this image is inferred by using an image list parameter of the unread shadow image. Moreover, an inspection image having an inspection kind/image list parameter is called from a data base 3. In this case, image display means 10a, 10b have a relation to a shadow read image, and by executing comparison and shadow reading, a diagnosis is executed exactly, and the diagnostic time can be shortened. |