| 摘要 |
PURPOSE:To easily specify a defectively connected point by providing a comparing means to compare test data from a test data storing means with contents from a comparison storing means. CONSTITUTION:This circuit is equipped with a test data register 2 to invert a signal between LSIs from an LSI-B 20 and to store the signal in an LSI-A 10, comparison register 4 to store the inverted output of this test data register 2, comparator 5 to compare the contents of the test data register 2 with the contents of the comparison register 4, and loops 1, 3, 6 and 7 to transmit the LSI-A 10 and the LSI-B 20 and to return the data to the original test data register 2 after inverting them while being equipped with the test data register 2. When both lines 103 and 104 for exchanging LSI signals are correctly connected, a coincident output '0' of the comparator 5 is impressed to a line 109 and when one of the lines 103 and 104 is not connected at least, a comparative non-coincident output '1' is outputted to a line 107. |
