发明名称 MANUFACTURE OF LEAD FRAME FOR SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To improve accuracies of shapes and positions of inner leads by pressing a 42 alloy lead frame and then annealing for a residual stress at a high temperature for a short time. CONSTITUTION:After inner leads 2 of a lead frame 1 for a semiconductor device are plate-retained and punched, it is annealed for residual stress at a high temperature for a short time such as at 700 deg.C for 3-6min. After outer leads 4 of the frame 1 are punched by pressing, it is annealed for residual stress at a high temperature for a short time such as at 700 deg.C for 1min, and Vickers hardness of a material hardness of a burr of the lead 4 is softened to 180-220 deg.C of Vickers hardness. Thus, inner residual stresses of the inner and outer leads generated by punching can be released, and also an inner residual stress due to elongation of a guide rail 3 generated by pressing is alleviated.</p>
申请公布号 JPH0555426(A) 申请公布日期 1993.03.05
申请号 JP19910235594 申请日期 1991.08.23
申请人 SUMITOMO METAL MINING CO LTD 发明人 MORIMOTO WATARU;KURIYAMA KAZUHIKO
分类号 C21D9/00;H01L23/50 主分类号 C21D9/00
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