| 摘要 |
A test device (TD) for an electronic device (DUT) includes a pattern generating circuit (PGU), a plurality of comparators (DC) and a memory (CM). The pattern generating circuit generates at least one input pattern. The electronic device under test is supplied with the input pattern and generating a corresponding output signal (OUTa). The comparators are connected to the electronic device under test and are supplied with the output signal therefrom. The comparators compare the output signal with an expected output signal (OUTe) with mutually different timing of comparison. The memory stores the comparison results supplied from the comparators. Characteristics of the electronic device under test are obtained from the comparison results stored in the memory. |
