| 摘要 |
<p>PURPOSE:To shorten the operation time required for test and to improve the reliability of testing accuracy. CONSTITUTION:A ROM class 22, a ROM manufacturing date 23, a version number 24 and a check sum value 25 are read out in an EEPROM from the information stored in a ROM and the normalcy of the ROM is tested from the output signal of a testing time detection circuit and the information stored in the EEPROM.</p> |
