DISPOSITIVOS DE CIRCUITO INTEGRADO OU IMPRESSO,TESTADOR PARA OS MESMOS,METODOS DE TESTE E COMPUTADOR PESSOAL QUE OS COMPREENDE

摘要

This invention relates to integrated circuit devices and, more particularly, to the testing of the connection of such devices with a printed circuit board device such as a personal computer planar board. The invention contemplates in circuit testing of very large scale integrated (VLSI) devices having timing critical functions by use of controllable bi-directional driver/receivers associated with timing critical function pins.