发明名称 LINE DEFECT CORRECTING METHOD FOR ACTIVE MATRIX DISPLAY DEVICE
摘要 <p>PURPOSE:To correct the line defect caused by the disconnection of a signal line of an active matrix display device and to improve the yield of a product. CONSTITUTION:The tip part of a gate bus branch line 22 protruded toward a picture element electrode 41 from a gate bus line 21 becomes a gate electrode of a TPT 31, and the TFT 31 is formed by superposing a source electrode 32 and a drain electrode 33 by placing a gate insulating film between them thereon. On the other hand, in a source bus line 23, a source bus line protruding part 46 is formed toward the picture element electrode 41, and a redundant structure is formed by inserting and holding the gate insulating film and superposing a first conductive body piece 47 and a second conductive body piece 48 thereon. When a line defect caused by disconnection is detected, the base end part of the gate bus branch line 22, the superposed part of the gate bus branch line 22, the source electrode 32 and the drain electrode, a superposed part of the source bus line protruding part 46 and a first conductive body piece 47, and a superposed of a first and a second conductive body pieces 47, 48 are irradiated with a laser light, and by forming a bypass line on the side of a disconnection generated part, the line defect is obviated.</p>
申请公布号 JPH0519294(A) 申请公布日期 1993.01.29
申请号 JP19910170127 申请日期 1991.07.10
申请人 SHARP CORP 发明人 KANAMORI KEN;YAMAGUCHI YOSHIHISA;IRIE KATSUMI;MARUMOTO EIJI
分类号 G02F1/13;G02F1/133;G02F1/1343;G02F1/136;G02F1/1368;G09G3/36;H01L27/12;H01L29/78;H01L29/786 主分类号 G02F1/13
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