发明名称 Plasma processing system and method.
摘要 <p>An etching system comprises a plasma chamber (20), a charge exchange chamber (22) and a processing chamber (24), and the charge exchange chamber and the processing chamber are partitioned with a porous plate (34) provided with a number of fine linear microchannel holes (34A). Positive ions generated by the plasma chamber are accelerated by an accelerating electrode (26) in the charge exchange chamber, charge-exchanged and introduced as neutral particles into the processing chamber through the microchannel holes. Neutral particles are vertically entered into an object (S) to be processed as neutral particle beams of which directions are completely aligned by the microchannel holes. Even an object with a large area can be etched with high accuracy by making the porous plate in a size which meets the object. Thus, the plasma processing only with neutral particles is carried out with high accuracy even when the area of the object is large. &lt;IMAGE&gt;</p>
申请公布号 EP0522296(A2) 申请公布日期 1993.01.13
申请号 EP19920109655 申请日期 1992.06.09
申请人 KAWASAKI STEEL CORPORATION 发明人 KINOSHITA, OSAMU;MURAKAWA, SHIGEMI;KUBOTA, NAOKI
分类号 H01L21/205;C23F4/00;G21K1/14;H01J37/32;H01L21/302;H01L21/3065;H05H3/00 主分类号 H01L21/205
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