发明名称 Polishing pad
摘要 A polishing pad for semiconductor wafers, having a face shaped to provide a constant, or nearly constant, surface contact rate to a workpiece such as a semiconductor wafer, in order to effect improved planarity of the workpiece. The favored face shape is a sunburst pattern having nontapered rays, coaxial with the pad's rotation.
申请公布号 US5177908(A) 申请公布日期 1993.01.12
申请号 US19900468348 申请日期 1990.01.22
申请人 MICRON TECHNOLOGY, INC. 发明人 TUTTLE, MARK E.
分类号 B24B7/22;B24B13/01;B24B37/04;B24D11/00 主分类号 B24B7/22
代理机构 代理人
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