IC TEST DEVICE,申请号JP19910040215-传众专利搜索

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发明名称	IC TEST DEVICE
摘要
申请公布号	JPH052051(A)	申请公布日期	1993.01.08
申请号	JP19910040215	申请日期	1991.03.06
申请人	ADVANTEST CORP	发明人	TAKEDA AKIHIRO
分类号	G01R31/3183;G01R31/28	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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