| 摘要 |
<p>PURPOSE:To reduce the testing time when the operation is confirmed as a test, and to confirm the operation efficiently. CONSTITUTION:In an apparatus with delay operation function 10, a delay reducing means 18 for test to reduce the delay time is provided, and the delay reducing means 18 is made operational only in a testing time. And in the apparatus with delay operation function 10 in which a delay operation function member 14 is provided, the delay reducing means 18 for test to reduce the delay time is provided inside the apparatus, and at the same time, an external control means B to control the means 18 from the outside of the apparatus is provided. Furthermore, the above delay reducing means is made as a reed switch 18, and a magnetic field B is made as an external control means.</p> |
