发明名称 |
Deep UV light sensitive positive photoresist compositions. |
摘要 |
Positive photoresist compositions are disclosed, which comprise an admixture of: a) 1 to 25% of a latent photoacid; b) 10 to 40% of a film forming polymer; c) 1 to 40% of an organic additive having the structural formula: <CHEM> d) a suitable solvent. A method for producing a semiconductor device by coating a substrate with the positive photoresist composition is also disclosed.
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申请公布号 |
EP0520654(A1) |
申请公布日期 |
1992.12.30 |
申请号 |
EP19920305400 |
申请日期 |
1992.06.12 |
申请人 |
HOECHST CELANESE CORPORATION |
发明人 |
CHATTERJEE, SUBHANKAR |
分类号 |
G03F7/004;G03F7/029;G03F7/037;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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