CHECK DEVICE FOR SOLID-STATE IMAGE PICKUP ELEMENT

摘要

PURPOSE:To improve the check precision by detecting the assembles of small picture element defects of local level in a solid-state image pickup element check device. CONSTITUTION:Picture data read out from photoelectric conversion cells of a solid-state image pickup element A as the object to be checked is subjected to arithmetic processing by an arithmetic processing circuit 13. An all area clear counter circuit 14 and a divided area counter circuit 15 to which the arithmetic result of the arithmetic processing circuit 13 is inputted are provided. The all area counter circuit 14 counts the number of defective picture elements out of all picture elements to detect the presence or the absence of defects. The divided area counter circuit 15 counts the number of defective picture elements in each divided area to detect the presence or the absence of defects.