发明名称 Interferometric measurement of geometry and image quality of non-spherical surfaces - using two-beam interferometer with adjustable phase between measurement and reference paths
摘要 Interferometric measurement of the geometry and imaging quality of a non-spherical optical element or system (8) involves placing it in the aperture matched test beam path of a two-beam interferometer in which the phase between the reference and test paths is adjustable. Interferences are detected photoelectrically and evaluated by a computer. A spherical wavefront optimally matched to the measurement element, and with an aperture at least as large as the element's aperture, is produced by a further element or system (7) in the other path. The focal point of the further element is moved stepwise into the focal range (AB) of the measurement element by a positioning system (11). Resulting zone interferences are detected and used to determine the total aperture range of the measurement element or system.
申请公布号 DE4118215(A1) 申请公布日期 1992.12.17
申请号 DE19914118215 申请日期 1991.06.04
申请人 JENOPTIK CARL ZEISS JENA GMBH, O-6900 JENA, DE 发明人 HARNISCH, WOLFGANG, O-6902 JENA, DE;HEISE, JUERGEN, O-6900 JENA, DE;HEYER, ROLF, O-6908 JENA, DE
分类号 G01B11/255;G01M11/02 主分类号 G01B11/255
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