发明名称 LOW DEFECTIVE AMORPHOUS SEMICONDUCTOR DEVICE AND ITS FORMATION
摘要 PURPOSE:To acquire a low defective hydrogenated amorphous silicon-germanium alloy film which is important for improvement of efficiency of solar battery, optical sensor, etc. CONSTITUTION:A magnetic field is formed inside a vacuum chamber, hydrogen 1 to 20 times introduced raw gas amount is introduced, high frequency of 10W or more is introduced to 1cc/min of raw gas flow rate under pressure conditions of 30mTorr or less to form a film by plasma discharge, urbach energy and defective density of an acquired film are evaluated based on low energy optical spectrum by a fixed photoelectric current method to show that realization is possible by a method for carrying out optimization of film formation conditions. As shown in the figure, a film is realizd whose peak defective density is close to that of a hydrogen amorphous silicon film at urback energy of 10meV or less. Thereby, possibility of improvement of efficiency of solar battery, optical sensor, etc., is largely increased.
申请公布号 JPH04348024(A) 申请公布日期 1992.12.03
申请号 JP19910059940 申请日期 1991.03.25
申请人 HITACHI LTD 发明人 WATANABE TAKESHI;TSUJIKU SUSUMU;SHIMADA JUICHI;MATSUBARA SUNAO;MURAMATSU SHINICHI
分类号 H01L21/205;H01L31/04 主分类号 H01L21/205
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