发明名称 PROCESS FOR TREATING POLISHING CLOTHS USED FOR SEMICONDUCTOR WAFERS
摘要 In the chemo-mechanical polishing, in particular, of semiconductor wafers, the abrasion and the geometrical quality of the wafers decreases with increasing service life of the polishing cloth. This can be prevented by treating the polishing cloth in each case after the polishing operation in a manner such that a pressure field is impressed, essentially without mechanical stress, on the polishing cloth, which pressure field causes a treatment liquid to flow through the interior of the polishing cloth and in this process the residues produced during polishing are rendered mobile and removed. A baseplate placed transversely across the polishing cloth and having a flat working surface provided with exit openings for the treatment liquid is suitable for carrying out the process. In the treatment, the treatment liquid is forced beneath the baseplate into the moving polishing cloth so that the latter is gradually traversed by the zone through which flow takes place.
申请公布号 US5167667(A) 申请公布日期 1992.12.01
申请号 US19900533479 申请日期 1990.06.05
申请人 WACKER-CHEMITRONIC GESELLSCHAFT FUR ELEKTRONIK-GRUNDSTOFFE MBH 发明人 PRIGGE, HELENE;LANG, JOSEF
分类号 B24B53/10;B24B37/00;B24B37/04;B24B53/00;B24B53/007 主分类号 B24B53/10
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