DELAY TIME MEASURING CIRCUIT FOR LOGIC IC,申请号JP19910112033-传众专利搜索

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发明名称	DELAY TIME MEASURING CIRCUIT FOR LOGIC IC
摘要
申请公布号	JPH04340738(A)	申请公布日期	1992.11.27
申请号	JP19910112033	申请日期	1991.05.17
申请人	NEC IC MICROCOMPUT SYST LTD	发明人	SATO MASAAKI
分类号	G01R31/317;H01L21/66;H01L21/822;H01L27/04	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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