发明名称 Method for testing assembly susceptibility to electrostatic discharge events
摘要 Method for determining the susceptibility of a protective device protected electronic assembly to electrostatic discharge events. The protective component is subjected to an electrostatic discharge event and the amount of kinetic energy transferred to the protective component during the electrostatic discharge event is determined. The susceptibility of the assembly to electrostatic discharge events is then determined based upon the amount of kinetic energy transferred to the protective component during the electrostatic discharge event.
申请公布号 US5166624(A) 申请公布日期 1992.11.24
申请号 US19910704427 申请日期 1991.05.23
申请人 COMPAQ COMPUTER CORPORATION 发明人 ABERNATHY, MICHAEL G.
分类号 G01R31/00 主分类号 G01R31/00
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