发明名称 INTERFEROMETRIC PROFILOMETER SENSOR
摘要 The invention relates to an interferometer sensor for measuring distance changes of a small surface. The sensor defines a Mirau-like interferometer arrangement having a measurement surface and a reference surface. For making precise measurements of a small distance change, a retarder is arranged between these surfaces and effects a difference of the path differences between a measurement beam and a reference beam of approximately lambda /4 for two polarization directions. The powers of the radiation components with these polarization directions are measured by a detecting device. The detecting device includes a polarization-dependent beam splitter and two detectors.
申请公布号 US5166751(A) 申请公布日期 1992.11.24
申请号 US19900632916 申请日期 1990.12.24
申请人 CARL-ZEISS-STIFTUNG 发明人 MASSIG, JUERGEN H.
分类号 G01B9/02;G01B11/00;G01D5/26;G02B5/30;G02B21/18;G02B27/14 主分类号 G01B9/02
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