INSPECTING METHOD OF SEMICONDUCTOR LIGHT-EMITTING DEVICE,申请号JP19910103043-传众专利搜索

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发明名称	INSPECTING METHOD OF SEMICONDUCTOR LIGHT-EMITTING DEVICE
摘要
申请公布号	JPH04332841(A)	申请公布日期	1992.11.19
申请号	JP19910103043	申请日期	1991.05.09
申请人	MITSUBISHI ELECTRIC CORP	发明人	KUBOTA MASAYUKI
分类号	G01M11/00;G01R31/26	主分类号	G01M11/00
代理机构		代理人
主权项
地址

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