发明名称 Method and apparatus for measuring displacement having parallel grating lines perpendicular to a displacement direction for diffracting a light beam
摘要 A method and apparatus for generating and detecting changes in interference patterns such as may be used to measure small displacements. A collimated beam is diffracted to produce a standing wavefront along a surface. The surface is coincident with the surface of a device which emits a signal in response to changes in the intensity of the wave front. In one embodiment, the diffracting means is a grating and the signal emitting means includes a beam splitter that generates an interference pattern responsive to the intensity of the wave front. In another embodiment, the signal emitting means is a membrane that emits a signal in response to changes in the wavefront. The apparatus and method can be used in applications which include measurement of displacement and measurement of force in which no displacement takes place.
申请公布号 US5165045(A) 申请公布日期 1992.11.17
申请号 US19910774781 申请日期 1991.10.10
申请人 ESELUN, STEVEN A. 发明人 ESELUN, STEVEN A.
分类号 G01D5/38;G01L1/08 主分类号 G01D5/38
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