发明名称 |
BICMOS PROCESS FOR COUNTER DOPED COLLECTER |
摘要 |
In a BICMOS circuit the bipolar transistor base region is formed in an n-type well serving as the collector of the transistor. Boron ions are implanted at two different energy levels to form the base region (26) and to counter dope the well to form a region (34) below the base region which is more lightly doped than the remainder of the well. The ion implantation counter doping the well may comprise two energy levels. Such counter doping reduces the electric field at the collector base junction and reduces collector base capacitance. <IMAGE>
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申请公布号 |
GB2255226(A) |
申请公布日期 |
1992.10.28 |
申请号 |
GB19920003426 |
申请日期 |
1992.02.18 |
申请人 |
* INTEL CORPORATION |
发明人 |
STEPHEN T * CHAMBERS;RICHARD G * TAYLOR |
分类号 |
H01L27/06;H01L21/285;H01L21/331;H01L21/8249;H01L29/10;H01L29/73;H01L29/732 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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