发明名称 |
ELECTRICAL CIRCUIT TEST PROBE |
摘要 |
ELECTRICAL CIRCUIT TEST PROBE A probe for providing electrical contact to electrical circuits during the testing thereof. There is a tubular housing having an open end and a generally closed end with a main portion extending from the generally closed end towards the open end and a retaining and sliding bearing portion adjacent the open end having a diameter smaller than the main portion. A probe plunger is disposed in the tubular housing and has a cylindrical inner portion which is a slide fit and disposed within the main portion of the tubular housing and a cylindrical outer portion of a diameter smaller than the inner portion and forming a shoulder with the inner portion at a point of meeting. The outer portion of the plunger passes through the retaining and sliding bearing portion and has an outside diameter which is a slide fit to the inside diameter of the retaining and sliding bearing portion. A longitudinally compressible bias spring is disposed between the generally closed end of the tubular housing and the inner portion of the probe plunger under a pre-loading for biasing the probe plunger towards an extended position. |
申请公布号 |
CA1309464(C) |
申请公布日期 |
1992.10.27 |
申请号 |
CA19890609738 |
申请日期 |
1989.08.29 |
申请人 |
QA TECHNOLOGY COMPANY, INC. |
发明人 |
COE, THOMAS D. |
分类号 |
G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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