发明名称 TESTING APPARATUS FOR X-RAY DETECTOR
摘要 PURPOSE:To obtain the title apparatus capable of performing the operations test of the detection circuit of an X-ray detector in a state near to the actual operation of the detector. CONSTITUTION:A uniform random number generator 10, a threshold generator 11, a comparator 12 and a dummy X-ray pulse generator 13 are provided. At the time of (random number value RVD < threshold value REP) or (random number value RND > threshold value REF), the comparator 12 generates a rectangular pulse 14 and the pulse generator 13 generates a dummy X-ray pulse 15. When the threshold valve REF is allowed to approach 0 or 255, the pulse becomes a state obeying Poisson's distribution. Since the dummy X-ray pulse 15 can be generated almost according to Poisson's distribution by this method, the operation of the detection circuit of an X-ray detector can be tested under a condition near to actual operation.
申请公布号 JPH04299279(A) 申请公布日期 1992.10.22
申请号 JP19910063638 申请日期 1991.03.28
申请人 SHIMADZU CORP 发明人 ADACHI SUSUMU
分类号 G01T7/00 主分类号 G01T7/00
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