METHOD OF MEASURING THICKNESS OF LAYERS OF DOUBLE-LAYER MATERIAL,申请号SU19904889180-传众专利搜索

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发明名称	METHOD OF MEASURING THICKNESS OF LAYERS OF DOUBLE-LAYER MATERIAL
摘要
申请公布号	RU1768970(C)	申请公布日期	1992.10.15
申请号	SU19904889180	申请日期	1990.12.10
申请人	RIZHSKIJ NII RADIOIZOTOPNOGO PRIBOROSTROENIYA	发明人	MUSSONOV GENNADIJ P,SU;ABELTIN VLADIMIR V,SU;KONONCHUK VITALIJ M,SU;GRAUDIN ANETA YU,SU
分类号	G01B15/02	主分类号	G01B15/02
代理机构		代理人
主权项
地址

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