TESTING PROCESS FOR ELECTRONIC DEVICES

摘要

TESTING PROCESS FOR ELECTRONIC DEVICES Electronic devices such as hybrid integrated circuits such as those having test points spaced less than 1250 .mu.m are advantageously evaluated utilizing a two-probe process. In this process the probes are moved between test points ina pattern that reduces movement distance without concern for any ordering imposed by the nets themselves or the test to be made. Additionally, the test ismade so that the movement time is the limiting factor.