发明名称 SCAN CIRCUIT FOR CIRCUIT TEST
摘要 PURPOSE:To discriminate a trouble of a wiring under test or a trouble of a scan circuit for circuit test if no coincidence is obtained between the outputted value and the expected value and at the same time to specify a trouble area of the scan circuit. CONSTITUTION:A scan circuit for circuit test is contained in a circuit 1 and outputs the value of a prescribed area of a tested circuit 2 to a circuit tester with a read signal received from the circuit tester. In this case, the scan circuits 3 and 4 are provided in two systems independent of each other. A first scan circuit 3 performs the test of the circuit 2 and at the same time inputs the test signals to each point of a second scan circuit 4 to output an answer signal to the circuit tester for execution of the test of the circuit 4. Meanwhile the second scan circuit 4 inputs the test signals to each point of the first circuit 3 and also outputs an answer signal to the circuit tester for execution of the test of the first scan circuit 3.
申请公布号 JPH04278644(A) 申请公布日期 1992.10.05
申请号 JP19910063667 申请日期 1991.03.06
申请人 FUJITSU LTD 发明人 HANABUSA AKIHIKO
分类号 G06F11/22 主分类号 G06F11/22
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