SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING A TEST CIRCUIT,申请号EP19910301985-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING A TEST CIRCUIT
摘要
申请公布号	EP0448263(A3)	申请公布日期	1992.09.30
申请号	EP19910301985	申请日期	1991.03.11
申请人	FUJITSU LIMITED	发明人	KATAKURA, HIROSHI;YOSHIDA, MAKOTO;KOKADO,MASAYUKI
分类号	G01R31/317;G01R31/28;G01R31/3185;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/318	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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