发明名称 FAIL-SAFE TESTING OF AN INFRARED SENSOR ARRANGEMENT
摘要 Device for fail-safe testing of a condition indicating device including at least one infrared sensor. The infrared sensor is connected by amplifiers to comparators which have different threshold values and have outputs connected to a microprocessor. An infrared signal transmitter is actuated by the microprocessor at periodic intervals to produce signals which are detectable by the infrared sensor. The microprocessor delivers an alarm signal if the test signal is not received by the infrared sensor within a specified period after triggering of the transmitter. The microprocessor also monitors the time occurrence of noise signals produced by the infrared sensor, and produces an alarm if no noise signals are received within a specified period. During monitoring of reception of transmitted test signals, monitoring of the noise signals is interrupted to prevent the test signal reception from being processed as a noise signal. In another preferred embodiment, the infrared signal transmitter is positioned several meters from the infrared sensor, and actuated through coded infrared transmissions from the control circuits. In this embodiment, no noise monitoring is required.
申请公布号 US5151682(A) 申请公布日期 1992.09.29
申请号 US19910711534 申请日期 1991.06.10
申请人 MARINITSCH, WALDEMAR 发明人 MARINITSCH, WALDEMAR
分类号 B60R25/10;G08B29/02 主分类号 B60R25/10
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