发明名称 Ring crystallization of wafers to prevent thermal shock
摘要 A ring of polycrystalline material is developed around the edge of a wafer by general heating of the wafer and localized heating with a laser beam followed by rapid cooling. The ring of polycrystalline material helps prevent wafer breakage due to thermal shock. One or more additonal ring, loop or closed figures of polycrystalline material can be formed inside of said ring of polycrystalline material developed around the edge of the wafer to further reinforce the wafer.
申请公布号 US5149675(A) 申请公布日期 1992.09.22
申请号 US19900636314 申请日期 1990.12.31
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 WILLS, KENDALL S.;RODRIGUEZ, PAUL A.;BREWER, MELVIN L.
分类号 C30B33/00 主分类号 C30B33/00
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