Test arrangement for electrical components - has contact elements protruding from carrier and pressed against contacts of component by actuator with oppositely movable sliders
摘要
A test arrangement for electrical components has a carrier (14) with several protruding contact elements (16) movable w.r.t. the carrier by an actuator so as to press against contacts (11) of the electrical component (12). There is a pair of flat spring contact elements (16a,16b) to grip each side of each contact. The actuator has two mutually oppositely movable sliders transverse to the contact elements. One deforms one element of a pair and the other deforms the opposite element. USE/ADVANTAGE - The simple test arrangement for electrical components has a low build height and ensures a reliable contact in a short time.
申请公布号
DE4107387(A1)
申请公布日期
1992.09.10
申请号
DE19914107387
申请日期
1991.03.08
申请人
PROTECH AUTOMATION GMBH, 5000 KOELN, DE
发明人
BLOECKER, DETLEF, DIPL.-ING., 5330 KOENIGSWINTER, DE