| 摘要 |
<p>PURPOSE:To provide a marking method which has a short drying time of ink for marking a quality-defective product in a quality inspecting step of a semiconductor laser chip and provides easy read. CONSTITUTION:In a device for sequentially inspecting the qualities of a plurality of chips on an inspection stage 3, and marking, in the case of a defective product, on the surface of the chip 1 to be able to distinguish the defective chip, optical curable ink is used as ink for marking the surface of the chip 1. The curable ink has faster curing speed than that of thermosetting ink and does not cause coating spot like volatile ink, and hence can mark excellently.</p> |
