发明名称 Photometric parameter photoelectric measurement for material analysis - using light source with four or more closely spaced LEDs and photodetector relatively distant from source
摘要 The arrangement allows for the photoelectric measurement of a photomtric parameter varying with the passage of light through a transmissive medium and has a light source and photodetector arranged on a common optical axis. The light source (10) consists of several, pref. 4, light emitting diodes (16-19) or LEDs arranged essentially parallel to the optical axis. The separation of the LEDs is negligible w.r.t. the distance between the light source and photodetector (11). USE/ADVANTAGE - Esp. for analysing material contents of specimen with increased accuracy using simple compact arrangement.
申请公布号 DE4105493(A1) 申请公布日期 1992.08.27
申请号 DE19914105493 申请日期 1991.02.21
申请人 HELMUT WINDAUS LABORBEDARF UND CHEMIKALIEN, 3392 CLAUSTHAL-ZELLERFELD, DE 发明人 SZLAPA, ANDRZEJ;LOBODA, LESZEK, WARSCHAU/WARSZAWA, PL
分类号 G01N21/25 主分类号 G01N21/25
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