MARKING METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE,申请号JP19910013662-传众专利搜索

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发明名称	MARKING METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要
申请公布号	JPH04239145(A)	申请公布日期	1992.08.27
申请号	JP19910013662	申请日期	1991.01.11
申请人	MITSUBISHI ELECTRIC CORP	发明人	NAKAJIMA DAISUKE
分类号	H01L21/66;H01L21/82	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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