发明名称 |
LOOP-BACK TESTING CIRCUIT |
摘要 |
The loop back testing circuit executes loop back test, not stopping the operation of data link interfacing unit, by receiving loop back instruction and time slot designating data transmitted from a microprocessor when data link is operated abnormally. The circuit comprises a signal terminal master interfacing unit (20) for interfacing the loopback control data of a CPU, a delay unit (10) for delaying frame synchronous signal transmitted from a time switch, a counter (30) for counting time slot designating data, a time slot switch unit (40) for opening time slot to which a loop back test is applied, a LED driving unit (50) for displaying that the loopback test is on and a data path switch unit (60) for controlling data path.
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申请公布号 |
KR920007139(B1) |
申请公布日期 |
1992.08.27 |
申请号 |
KR19900003944 |
申请日期 |
1990.03.23 |
申请人 |
KOREA TELECOMMUNICATIONS CORP.;KOREA ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
IM, SONG - RYOL;LEE, HYONG - HO |
分类号 |
H04M3/26;(IPC1-7):H04M3/26 |
主分类号 |
H04M3/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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