发明名称 POSITIVE TYPE ELECTRON BEAM RESIST
摘要 PURPOSE:To obtain the positive type electron beam resist which has a high sensitivity and good dry etching resistance. CONSTITUTION:This resists consists essentially of the alpha-cyanoacrylic ester-alpha- methyl styrene expressed by formula I. In the formula I, R denotes a 6 to 8C chain or cyclic alkyl group. The copolymn. ratio m/n of the alpha-cyanoacrylic ester alpha-methyl styrene is preferably 3/7 to 7/3 and the mol. wt. is preferably 10000 to 3000000, more particularly preferably 100000 to 1000000.
申请公布号 JPH04234761(A) 申请公布日期 1992.08.24
申请号 JP19910010310 申请日期 1991.01.04
申请人 TOPPAN PRINTING CO LTD;TOAGOSEI CHEM IND CO LTD 发明人 TAMURA AKIRA;YONEZAWA MASAJI;FUJIMOTO YOSHIAKI;SATO MITSUYOSHI
分类号 G03F7/039;H01L21/027 主分类号 G03F7/039
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