发明名称 |
POSITIVE TYPE ELECTRON BEAM RESIST |
摘要 |
PURPOSE:To obtain the positive type electron beam resist which has a high sensitivity and good dry etching resistance. CONSTITUTION:This resists consists essentially of the alpha-cyanoacrylic ester-alpha- methyl styrene expressed by formula I. In the formula I, R denotes a 6 to 8C chain or cyclic alkyl group. The copolymn. ratio m/n of the alpha-cyanoacrylic ester alpha-methyl styrene is preferably 3/7 to 7/3 and the mol. wt. is preferably 10000 to 3000000, more particularly preferably 100000 to 1000000. |
申请公布号 |
JPH04234761(A) |
申请公布日期 |
1992.08.24 |
申请号 |
JP19910010310 |
申请日期 |
1991.01.04 |
申请人 |
TOPPAN PRINTING CO LTD;TOAGOSEI CHEM IND CO LTD |
发明人 |
TAMURA AKIRA;YONEZAWA MASAJI;FUJIMOTO YOSHIAKI;SATO MITSUYOSHI |
分类号 |
G03F7/039;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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