| 摘要 |
PURPOSE:To shorten a time for analysis of crystal orientation and also to improve the precision in analysis. CONSTITUTION:After a sample 4 is fixed on a sample stage 5, an X-ray is applied thereto from an X-ray generating device 1, while a position detecting type proportional counter tube 3 is rotated at each prescribed time by a prescribed angle around the sample. During the rotation of the counter tube 3, an angle of incidence of the X-ray and data on a counting rate from the position detecting type proportional counter tube 3 are inputted to a data processing device 8, and the index of a crystal face is determined from an angular relationship on the basis of exponential data in each crystal structure and displayed in CRT 9. |
