TEST LATCH CIRCUIT,申请号EP19900307156-传众专利搜索

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发明名称	TEST LATCH CIRCUIT
摘要
申请公布号	EP0420388(A3)	申请公布日期	1992.08.05
申请号	EP19900307156	申请日期	1990.06.29
申请人	SGS-THOMSON MICROELECTRONICS, INC. (A DELAWARE CORP.)	发明人	DOYLE, BRUCE ANDREW
分类号	G01R31/317;G01R31/28;G01R31/3185;G11C29/24;G11C29/52;(IPC1-7):G01R31/318	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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