METHOD OF CHECKING ELECTRIC PARAMETERS OF RADIOELECTRONIC COMPONENTS,申请号SU19894736870-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	METHOD OF CHECKING ELECTRIC PARAMETERS OF RADIOELECTRONIC COMPONENTS
摘要
申请公布号	SU1751703(A1)	申请公布日期	1992.07.30
申请号	SU19894736870	申请日期	1989.09.07
申请人	SHCHERBAKOV VADIM V,SU	发明人	SHCHERBAKOV VADIM V,SU
分类号	G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Substrate edge seal and clamp for low-pressure processing equipment

DUAL ACTION VALVE

AUTOMATIC FREQUENCY CONTROL CIRCUIT

Affinity electrode for electrochemical analysis

Cold-storage appliance

Medicaments containing pantothenic acid

Structure comprising honeycomb core and outer skin

FASTENERS HAVING COORDINATED SELF-SEEKING CONFORMING MEMBERS AND USES THEREOF

Rubber composition containing silica having first and second aggregates each containing different particle sizes

CONDITIONING SHAMPOO COMPOSITIONS CONTAINING EMULSION POLYMERIZED POLYMERS

Heat-curable powder coating

Scanning system and method

Connector with integral cable clamp

Autocalibration of an A/D converter within a CMOS type image sensor

锁相环同步电路和方法

抗病毒专用药肥

用于接触透镜的改进的衣康酸酯共聚物组合物

Method for processing polluted fluid

Hydraulic press