ELECTRON BEAM TESTER,申请号JP19900340144-传众专利搜索

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发明名称	ELECTRON BEAM TESTER
摘要
申请公布号	JPH04208883(A)	申请公布日期	1992.07.30
申请号	JP19900340144	申请日期	1990.11.30
申请人	FUJITSU LTD	发明人	NAKAZAWA KAZUHIRO;ITO AKIO
分类号	G01R31/302;H01J49/02;H01J49/08	主分类号	G01R31/302
代理机构		代理人
主权项
地址

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