发明名称 SEMICONDUCTOR MANUFACTURING DEVICE
摘要 PURPOSE:To prevent the scattering of resist on the outer circumference of a semiconductor, and to make it possible to apply the resist uniformly by a method wherein the position of a nozzle is detected and the resist is dripped while the rotational speed of the semiconductor substrate is being controlled. CONSTITUTION:A semiconductor substrate 1 is fixed by sucking to a chuck 2, it is rotated by a rotary motor 3, and a nozzle 4 is moved in radial direction on the substrate by a ball screw 9 and a nozzle moving motor 5. The position of the nozzle 4 is detected by the nozzle position detecting sensor 6 of the rotary encoder and the like coupled to the motor 5. The signal sent from the sensor 6 is treated by a rotation control unit 7, and the substrate 1 is coated with a resist by controlling a motor power source 8 in such a manner that the relative speed of the substrate 1 and the nozzle 4 is being kept constant. As a result, the scattering of the resist dripped on the outer circumference of the substrate can be prevented, and a uniform film is obtained.
申请公布号 JPH04188611(A) 申请公布日期 1992.07.07
申请号 JP19900313602 申请日期 1990.11.19
申请人 NEC KYUSHU LTD 发明人 NAKAMURA MASATOSHI
分类号 G03F7/16;B05C11/08;G03F7/30;H01L21/027 主分类号 G03F7/16
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