发明名称 An active matrix substrate inspecting device.
摘要 <p>A device and method for inspecting any fault in an active matrix substrate which includes a transparent conductive film on the substrate, an orientation film on the transparent conductive film, a polymer sheet opposite the orientation film with a liquid crystal sandwiched therebetween, a spacer for maintaining a space between the orientation film and the polymer sheet. An electrical modulation is observed in the liquid crystal by applying a voltage across the pixel electrode and the transparent conductive film. &lt;IMAGE&gt;</p>
申请公布号 EP0493025(A2) 申请公布日期 1992.07.01
申请号 EP19910311876 申请日期 1991.12.20
申请人 SHARP KABUSHIKI KAISHA 发明人 OKAMOTO, MASAYA;FUNADA, FUMIAKI;YOSHII, SHOJI
分类号 G01R1/07;G01R31/308;G02F1/13;G02F1/135;G02F1/1362 主分类号 G01R1/07
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