发明名称 |
An active matrix substrate inspecting device. |
摘要 |
<p>A device and method for inspecting any fault in an active matrix substrate which includes a transparent conductive film on the substrate, an orientation film on the transparent conductive film, a polymer sheet opposite the orientation film with a liquid crystal sandwiched therebetween, a spacer for maintaining a space between the orientation film and the polymer sheet. An electrical modulation is observed in the liquid crystal by applying a voltage across the pixel electrode and the transparent conductive film. <IMAGE></p> |
申请公布号 |
EP0493025(A2) |
申请公布日期 |
1992.07.01 |
申请号 |
EP19910311876 |
申请日期 |
1991.12.20 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
OKAMOTO, MASAYA;FUNADA, FUMIAKI;YOSHII, SHOJI |
分类号 |
G01R1/07;G01R31/308;G02F1/13;G02F1/135;G02F1/1362 |
主分类号 |
G01R1/07 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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