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发明名称
METHOD FOR TESTING SEMICONDUCTOR STORING CIRCUIT ELEMENT
摘要
申请公布号
JPH04177852(A)
申请公布日期
1992.06.25
申请号
JP19900306917
申请日期
1990.11.13
申请人
NEC YAMAGUCHI LTD
发明人
HIROKANE MASAKAZU
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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