| 摘要 |
PATENT 13DV-10360 PROBE FOR AN EXTENSOMETER Disclosed herein are probes for mounting on an extensometer used in conjunction with a materials testing machine, and can be used in high temperature applications. Each probe includes a probe shaft with a tip and a probe support body mounted to a hollow shield tube over the probe shaft. The probe support body includes a tipped segment which is biased toward the tip of the probe shaft. A longitudinal axis passes through the tips and tipped segment, respectively. The hollow shield tube mounted over the probe shaft is made of a high temperature material having a low thermal conductivity coefficient. The sleeve prevents excessive temperature transients from affecting the probe shaft.
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